“atomic force microscope”的概念、定义、习题解题方法及翻译-物理辞典

单词	atomic force microscope
释义	atomic force microscope(AFM) A type of microscope in which a small probe, consisting of a tiny chip of diamond, is held on a spring-loaded cantilever in contact with the surface of the sample. The probe is moved slowly across the surface and the tracking force between the tip and the surface is monitored. The probe is raised and lowered so as to keep this force constant, and a profile of the surface is produced. Scanning the probe over the sample gives a computer-generated contour map of the surface. The instrument is similar to the scanning tunnelling microscope, but uses mechanical forces rather than electrical signals. It can resolve individual molecules and, unlike the scanning tunnelling microscope, can be used with nonconducting samples, such as biological specimens
随便看	Tokamak tomography topological invariant topology torque torr Torricellian vacuum torsion torsion balance torus total internal reflection total-radiation pyrometer totality tracing trajectory transactinide element transcendental number transducer transformer transient transistor transition point translation translucent transmission coefficient

物理辞典收录了3346条物理词条，基本涵盖了常用物理知识及物理英语单词词组的翻译及用法，是物理学习的有利工具。